Szu Huat received his BEng and PhD in electrical and computer engineering from the National University of Singapore. His doctorate research on simulation and implementation of aplanatic refractive solid immersion lens was awarded a conference best paper and part of a team project that received the 2009 Singapore President’s Technology award. He co-worked with the team members from an SME to commercialize the lens in 2009. Dr Goh is currently with GLOBALFOUNDRIES, Product, Test and Failure Analysis division, Singapore, where he leads a team responsible for product failure diagnostics and advanced methodologies to accelerate yield ramp. His main focus is on the development of dynamic fault isolation techniques, wafer level fault isolation methods and leveraging cross-functional domain knowledge of design, test and failure analysis to enhance yield learning. His works have been published in conferences and journals. Together with his team, he invented a new technique called Electrically-enhanced LADA which was accorded a conference best paper in 2015. Szu Huat has been a tutorial speaker for the past 3 years for the International Symposium for Testing and Failure Analysis (ISTFA) US conference. He is also the technical program chair for the International Physical and Failure Analysis (IPFA) in 2016.