*Programs and Topics are subject to change without prior notice
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Track Theme: Device & System Level Test Challenges and Advancement for High-Performance Applications
Disruptive technologies bring the world into the new era of digitalization. With the rise in demand for such functionalities in applications like automotive, wireless communication, CMOS image sensors and IoT connectivity; stringent test & reliability requirements are expected. Test challenges in automotive System-on-Chips, high-density memory test challenges and emerging technologies such as 5G testing will be discussed in this forum. The forum will explore ways in the aspects on improving test efficiencies, metrology for yield enhancement and data predictability.
Distinguished Speakers (Inviting):
Advantest, AEM, AMS, GF, Intel, Keysight, Mentor, Microchip, National Instruments, Rohode & Schwarz, TEL, UTAC