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Product & System Level Testing Forum [5]

MY 9-10 | Level 1A | MITEC Thursday, May 14
9:00am to 3:00pm
Registration Fee Applicable

*Programs and Topics are subject to change without prior notice

REGISTRATION FEE (Early Bird Rate - till 12 April 2020) - Save up to 15% savings!

 SEMI Member USD 80 SGD 110
 Non-Member USD 100 SGD 140
 Student (with valid student pass) USD 50 SGD 65
 Group Discount (3 pax & above) Enjoy additional 15% off early bird rate!

Keen to attend? Register Here

This forum is supported by HRDF.
For Malaysia Companies HRDF Claim: Please download the Letter of Endorsement from HRDF.
The approval of the training grant is subject to the terms and conditions set by PSMB. Please contact HRDF for more information.
Download Letter of Endorsement.

Track Theme: Device & System Level Test Challenges and Advancement for High-Performance Applications

Synopsis:
Disruptive technologies bring the world into the new era of digitalization. With the rise in demand for such functionalities in applications like automotive, wireless communication, CMOS image sensors and IoT connectivity; stringent test & reliability requirements are expected. Test challenges in automotive System-on-Chips, high-density memory test challenges and emerging technologies such as 5G testing will be discussed in this forum. The forum will explore ways in the aspects on improving test efficiencies, metrology for yield enhancement and data predictability.

Sponsors:

 

Distinguished Speakers (Inviting):
Advantest, AEM, AMS, GF, Intel, Keysight, Mentor, Microchip, National Instruments, Rohode & Schwarz, TEL, UTAC

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