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Product & System Level Testing Forum (5)

MY 9-10 | Level 1A | MITEC Thursday, May 09
9:30am to 3:00pm
Registration Fee Applicable

*Programs and Topics are subject to change without prior notice
** Malaysia Companies HRDF Claim , Please click to download the Letter of Endorsement from HRDF. (Subject to T&C and please contact HRDF for more information)

Theme: Internet-of-Things Impact on Semiconductor Testing

Synopsis: The evolution of Internet has given rise to quick access of data, transformed into useful info and then generate actions that affect our daily lives. The data are collected from “Things”, in the IoT sense, a variety of devices with wide spectrum of applications such as medical applications, artificial intelligence, automotive sensing and more, connecting to billions of devices. 

To be able to handle these devices connected to the network, the transformation of 4G to 5G network would come faster than we can ever imagined.  In the next generation of network, it would couple with many standards to address different needs.  

As you examine closely, not only connectivity of the network would be complex, the system requirements such as CPU speed, power consumption, DFT and DSP, many of these devices would be ever demanding technologically and commercially to manufacture them.  

In this forum, the speakers from the industrial leading companies would give the audience the insight, and address the challenges in test that we might face as we are transforming into a the era of the connected information.

Downloadable Speakers Presentations:

Upon completing the survey sent, you will receive the link and password to download the presentation slides by speakers that has agreed to share/ publish their slides.
Please write to glim@semi.org, if you have not receive the suvery link.
 
- Mdm Meilin Lin, STMicroelectronics, Malaysia - Automated Test Monitoring System with Device Traceablility
- Ms Ang Ai Kiar & Ms Loh Wenqi, IBM Manufacturing Solutions - Shaping the Future
- Mr CH Tham, Intel Technology Sdn Bhd - Fast Load Test Program through Snapshot Visualization.
- Mr Aksel Yap, Tibco Software - Digital Twins for Yield
- Mr Gobinath Vanan Tamil, National Instruments, Boost Operational Efficiency with Distributed Systems Management 

 

Sponsored By

 

 

Do you want to attend this session? Register for SEMICON SEA

Mr. Alex LEONG
Staff Engineer
Advantest Sales and Support (M) Sdn. Bhd, Malaysia
Mr. Aksel YAP
Analytics Practice Lead.
TIBCO Software
Mr. CH THAM
Senior Software Development Engineer
Intel Technology Sdn. Bhd. , Malaysia
Mr. Gobinath Tamil VANAN
Field Marketing Manager – Semiconductor Industry
National Instruments, Malaysia
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