Mr. Prasad BACHIRAJU
Senior Director of Business Development, Onto Innovation
Prasad Bachiraju is the Senior director of business development and product marketing for Onto Innovation’s enterprise software business. With over 26 years of experience in the semiconductor industry, Prasad’s mission and passion is to work hand-in-hand with customers to build solutions using yield management and advanced process control systems. He began his career in the semiconductor industry at INSPEX Inc as a software engineer III in the DMS division prior to its acquisition by Rudolph Technologies in 1997. Prasad spent two decades at Rudolph in various engineering and customer facing roles prior to the Rudolph Technologies and Nanometrics merger in 2019 that formed Onto Innovation. Prasad has authored many papers collaborating with customers on reduced review and wafer level pattern recognition topics. He received a Master’s in computer applications from the National Institute of Technology, India.
Presentation Title
Achieving Zero Defect Manufacturing in Semiconductor Fabs
Abstract
Fab processes have become unimaginably complex with petabytes of data generation each day. Fab end customers in multiple market segments are demanding highly reliable chips with zero defect escapes!
With the recent technological advancements, most fabs have gone through (or will be going through) Digital Transformation which enables data integration. Still, about 80% of the data generated is not yet fully utilized. This webinar discusses how to achieve zero defect manufacturing in the fab with a five-step program providing fab use cases at each step covering challenges, solution, and benefits.
Fabs are not new to zero defect initiatives, however, it is more exciting and promising now with the advent of AI to achieve zero defect manufacturing in fabs. In this webinar we will cover three initiatives that enable fabs to mature and achieve their goals for zero defect. The key first initiative is to detect & classify the defects when they happen in the production timely, consistently and with high accuracy and purity. This task if not done efficiently and at all levels of data generated in the fab, it will impact productivity and lead to defect escapes. The second initiative is to identify the source of defects in the fab. Fabs already follow many best practices today to achieve root cause analytics (RCA), however, as discussed earlier, the success of RCA is directly correlated to percentage of data utilization. Additionally, we will be covering some use cases that highlight the importance of adopting Big Data and AI technology for faster and timely learnings in the fab that enable zero defects. The third initiative is all about prevention of defects in the fab. By utilizing process, equipment, and sub-fab data, APC and Equipment Monitoring systems can interact with fab host and equipment to proactively ensure wafer processing is optimized for zero defects and high yields.
We will also cover use cases for continuous improvement, bringing in BE and far BE final test data to understand unexplained chip failures both before and after chip shipments to fab customers. Ultimately, the goal of zero defect initiatives should not only help in building a high quality and reliable products but also help in reducing manufacturing costs, improve fab efficiency and mature fab into a smart factory.