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AI for Product Testing Forum
Day 2 | Wednesday, 6 May 2026 | 09:30 - 17:30
Novel 1, Level 1A, MITEC
Artificial intelligence is transforming IC testing by enabling smarter, faster, and more cost-effective solutions. From AI-driven fault detection and diagnosis to predictive analytics for yield improvement, these advancements address the growing complexity of modern integrated circuits. By automating test processes and enhancing accuracy, AI-powered testing accelerates time-to-market while reducing costs. This forum explores the latest innovations and applications of AI in reshaping the future of IC testing.
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