Mr. Mandip Singh KHORANA
Senior Director, Software Strategy APAC, National Instruments
Mandip is a seasoned expert in driving digital transformations within engineering processes, specializing in leveraging AI and machine learning to optimize test workflows and achieve insights in manufacturing environments. With a focus on accelerating latest technologies including autonomous driving and wireless technologies, Mandip has a deep understanding of the challenges and opportunities presented by integrating AI at the edge of test operations.
In his presentation titled "Implementing Real-time AI in High-Volume Test," Mandip plans to explore the complexities of deploying AI solutions in semiconductor manufacturing, particularly addressing the unique infrastructure and management needs essential for success at scale. Mandip's looks forward to engage with semiconductor professionals to seek valuable insights harnessing AI's transformative potential in their testing processes.
Presentation Title
Implementing Real-time AI in High-Volume Test
Abstract
AI has a lot of promise to solve complex production issues, particularly when it can be leveraged at the edge in high-volume manufacturing. But building AI-based solutions is a daunting task, and it’s not just about the AI model itself. It is also about all the infrastructure, management and tooling required to make it a reality at the edge. The problem is compounded in today’s typical semiconductor manufacturing environment where test is distributed across multiple test floors, often outsourced to other companies. In this session we will present an end-to-end solution using “Auto-ML” to generate models for data scientists and non-data scientists alike. We will show how together with our partners, we are bringing AI all the way to the Tester, enabling real-time decision making and binning.