Mr. Henry Chu
Application Engineer Advantest Corporation
Mr Henry Chu is a Staff Application Engineer at Advantest Malaysia with 18 years of working experience in system level and semiconductor testing. His role includes customer support in ATE’s test application and production support. His current focus is primarily on power analog controller in the automotive domain. Prior to Advantest, Henry was involved in power management and RF system level testing.
Henry graduated in 2004 and obtained his bachelor’s degrees (Electrical and Electronics) from University of Lincoln, UK.
Presentation Title
Challenges and Opportunities in Test Engineering for Complex Digital Devices
Presentation Abstract
The complexity of advanced semiconductor devices and the implementation of 2.5D/3D integration have posed enormous challenges to the test industry. The complex evolvement is producing a higher rate of new devices and generating a vast volume of test data. As such, this demands an increase in capacity and engineers in device bring-up, pattern generation, and characterization. The continuous momentum is leading to the expansion of engineering facilities which require more test systems in bringing the device to market. Another common challenge is the scalability and compatibility when bridging test solution and correlation, from silicon validation to high-volume manufacturing.
In this presentation, a lower-cost solution, which scales engineering capacity, and enabling more NPIs will be discussed. This solution addresses the challenge of cost pressure, capacity, and faster time to high-volume manufacturing.