Mr. Jesse LYLES
Vice President of Offering Management NI, United States
Jesse Lyles is a semiconductor industry veteran who has held roles from validation engineering, test engineering, product manager and general manager over his 25 years in the industry. Jesse has been fortunate to work in mixed signal, high speed SERDES and RF applications. During his time in the semiconductor industry, Jesse has always been a steward of efficiency and quality when it comes to validation and production test. He has developed some the leading edge techniques used in today’s validation labs. Today he continues that push to create a more efficient lab environment with NI’s Modern Lab, while streamlining the transition from validation to production using NI’s software and hardware test capabilities.
Presentation Title:
Do More with Less – A More Accurate and Faster IV-CV Measurement Approach
Many semiconductor elements and electronics devices require both current-voltage (IV) and capacitance-voltage (CV) measurements to extract critical information about a manufacturing process or validate device performance. Traditionally, IV measurements are made with a source measure unit (SMU), and the CV measurements are made with an LCR meter, capacitance measurement unit (CMU), or impedance analyzer. Systems needing both CV and IV measurements for a given device under test (DUT) must combine these two discrete instrument types with a switch, which degrades measurement accuracy and increases test time.
In this session, you will learn the state-of-the-art LCR instrument that could combine IV and CV test performing f-F/f-A class measurement in one and how does it improve the MEMS, Ultrasonic sensors, wafer parametric, and iPD CV/IV measurement accuracy while optimizing lab space. As device complexity continues to rise rapidly and time-to-market windows narrow, attend this session for finding new and innovative ways to adapt and keep up with throughput targets without an exorbitant cost.