Mr. Tze Hern KHOR
Senior Manager, SSD Test Development Micron, Singapore
Tze Hern is currently Senior Manager for SSD Test Development at Micron Technology. He has over 20 years of experience in the semiconductor test industry working on products such as Microprocessors, ASICS, FPGAs and storage/memory with roles ranging from Product/Test Engineering, Test Process, Test Equipment and Test Subcon management.
Presentation Title:
Test Flow Innovation using AI & Machine Learning
Bit growth for memory products is driving exponential growth in test time and increasing test equipment capex expenditure in order to ensure outgoing product quality. This presentation looks at opportunities, applications and challenges of using AI and Machine Learning innovations to optimize test flows in a manufacturing environment.