Integrated Circuit Technology, Testing and Dynamic Fault Isolation

This course provides comprehensive coverage of modern integrated circuit (IC) technology and testing methodologies in the evolving semiconductor industry. Moving beyond traditional Moore's Law scaling, the course explores 'More than Moore' technologies including photonic integrated circuits, electric vehicle semiconductors, and advanced memory devices (MRAM and Flash). 

Learners will gain practical knowledge of semiconductor fabrication processes and testing fundamentals, beginning with basic Automated Test Equipment (ATE) operations for digital circuits. The course progresses through various device-specific testing methodologies, emphasising design for testability principles and debugging techniques. 

Key topics include: 

•     Wafer technology and device fundamentals 

•     Digital and SRAM testing principles 

•     Advanced device testing (Silicon Carbide, Silicon Photonics, MRAM, Flash devices) 

•     Fault isolation techniques and electrical characterisation 

•     Testing considerations for emerging technologies in photonics and electric vehicle applications 

This module bridges theoretical understanding with industry practices, preparing learners for the challenges in modern semiconductor testing and characterisation.